Restrictions of wafer curvature stress measurements by thermally induced plastic substrate deformation

Research output: Contribution to conferencePresentationResearchpeer-review

External Organisational units

  • Materials Center Leoben Forschungs GmbH

Details

Original languageEnglish
Publication statusPublished - 2015
EventE-MRS Spring Meeting 2015 - Lille, France
Duration: 11 May 201515 May 2015

Conference

ConferenceE-MRS Spring Meeting 2015
Country/TerritoryFrance
CityLille
Period11/05/1515/05/15