Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy

Research output: Contribution to conferencePosterResearchpeer-review

Details

Translated title of the contributionPatterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
Original languageEnglish
Publication statusPublished - 2011
EventMRS Spring Meeting April 25-29 2011 San Francisco - San Francisco, United States
Duration: 25 Apr 201129 Apr 2011

Conference

ConferenceMRS Spring Meeting April 25-29 2011 San Francisco
Country/TerritoryUnited States
CitySan Francisco
Period25/04/1129/04/11