Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy. / Shen, Quan; Pavitschitz, Andreas; Hlawacek, Gregor et al.
2011. Poster session presented at MRS Spring Meeting April 25-29 2011 San Francisco, San Francisco, California, United States.
2011. Poster session presented at MRS Spring Meeting April 25-29 2011 San Francisco, San Francisco, California, United States.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Shen, Q, Pavitschitz, A, Hlawacek, G, Teichert, C, Edler, M, Radl, S, Grießer, T, Lex, A, Höfler, T, Trimmel, G & Kern, W 2011, 'Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy', MRS Spring Meeting April 25-29 2011 San Francisco, San Francisco, United States, 25/04/11 - 29/04/11.
APA
Shen, Q., Pavitschitz, A., Hlawacek, G., Teichert, C., Edler, M., Radl, S., Grießer, T., Lex, A., Höfler, T., Trimmel, G., & Kern, W. (2011). Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy. Poster session presented at MRS Spring Meeting April 25-29 2011 San Francisco, San Francisco, California, United States.
Vancouver
Shen Q, Pavitschitz A, Hlawacek G, Teichert C, Edler M, Radl S et al.. Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy. 2011. Poster session presented at MRS Spring Meeting April 25-29 2011 San Francisco, San Francisco, California, United States.
Author
Bibtex - Download
@conference{732792ac16bb45f28e2485cdfc77083f,
title = "Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy",
author = "Quan Shen and Andreas Pavitschitz and Gregor Hlawacek and Christian Teichert and Matthias Edler and Simone Radl and Thomas Grie{\ss}er and Alexandra Lex and Thomas H{\"o}fler and Georg Trimmel and Wolfgang Kern",
year = "2011",
language = "English",
note = "MRS Spring Meeting April 25-29 2011 San Francisco ; Conference date: 25-04-2011 Through 29-04-2011",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
AU - Shen, Quan
AU - Pavitschitz, Andreas
AU - Hlawacek, Gregor
AU - Teichert, Christian
AU - Edler, Matthias
AU - Radl, Simone
AU - Grießer, Thomas
AU - Lex, Alexandra
AU - Höfler, Thomas
AU - Trimmel, Georg
AU - Kern, Wolfgang
PY - 2011
Y1 - 2011
M3 - Poster
T2 - MRS Spring Meeting April 25-29 2011 San Francisco
Y2 - 25 April 2011 through 29 April 2011
ER -
