Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

Research output: Contribution to journalArticleResearchpeer-review

Standard

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism. / Hlawacek, Gregor; Veligura, Vasilisa; Lorbek, Stefan et al.
In: Beilstein journal of nanotechnology , Vol. 3, 2012, p. 507-512.

Research output: Contribution to journalArticleResearchpeer-review

Vancouver

Hlawacek G, Veligura V, Lorbek S, Mocking TF, George A, van Gastel R et al. Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism. Beilstein journal of nanotechnology . 2012;3:507-512. doi: 10.3762%2Fbjnano.3.58

Bibtex - Download

@article{7164e1adfa204f67b0e84122ad9a4a6e,
title = "Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism",
author = "Gregor Hlawacek and Vasilisa Veligura and Stefan Lorbek and Mocking, {Tijs F.} and Antony George and {van Gastel}, Raoul and Zandvliet, {Harold J. W.} and Bene Poelsema",
year = "2012",
doi = "10.3762%2Fbjnano.3.58",
language = "English",
volume = "3",
pages = "507--512",
journal = "Beilstein journal of nanotechnology ",
issn = "2190-4286",
publisher = "Beilstein-Institut Zur Forderung der Chemischen Wissenschaften",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

AU - Hlawacek, Gregor

AU - Veligura, Vasilisa

AU - Lorbek, Stefan

AU - Mocking, Tijs F.

AU - George, Antony

AU - van Gastel, Raoul

AU - Zandvliet, Harold J. W.

AU - Poelsema, Bene

PY - 2012

Y1 - 2012

U2 - 10.3762%2Fbjnano.3.58

DO - 10.3762%2Fbjnano.3.58

M3 - Article

VL - 3

SP - 507

EP - 512

JO - Beilstein journal of nanotechnology

JF - Beilstein journal of nanotechnology

SN - 2190-4286

ER -