High resolution determination of local residual stress gradients in single- and multilayer thin film systems
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In: Acta materialia, Vol. 103, 2016, p. 616-623.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - High resolution determination of local residual stress gradients in single- and multilayer thin film systems
AU - Treml, Ruth
AU - Kozic, Darian
AU - Zechner, Johannes
AU - Maeder, Xavier
AU - Gänser, Hans-Peter
AU - Schöngrundner, Ronald
AU - Michler, Johann
AU - Brunner, Roland
AU - Kiener, Daniel
PY - 2016
Y1 - 2016
U2 - 10.1016/j.actamat.2015.10.044
DO - 10.1016/j.actamat.2015.10.044
M3 - Article
VL - 103
SP - 616
EP - 623
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -