High resolution determination of local residual stress gradients in single- and multilayer thin film systems

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High resolution determination of local residual stress gradients in single- and multilayer thin film systems. / Treml, Ruth; Kozic, Darian; Zechner, Johannes et al.
In: Acta materialia, Vol. 103, 2016, p. 616-623.

Research output: Contribution to journalArticleResearchpeer-review

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Treml R, Kozic D, Zechner J, Maeder X, Gänser HP, Schöngrundner R et al. High resolution determination of local residual stress gradients in single- and multilayer thin film systems. Acta materialia. 2016;103:616-623. doi: 10.1016/j.actamat.2015.10.044

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Bibtex - Download

@article{4abf8481d42349609581e56312e1ca1b,
title = "High resolution determination of local residual stress gradients in single- and multilayer thin film systems",
author = "Ruth Treml and Darian Kozic and Johannes Zechner and Xavier Maeder and Hans-Peter G{\"a}nser and Ronald Sch{\"o}ngrundner and Johann Michler and Roland Brunner and Daniel Kiener",
year = "2016",
doi = "10.1016/j.actamat.2015.10.044",
language = "English",
volume = "103",
pages = "616--623",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - High resolution determination of local residual stress gradients in single- and multilayer thin film systems

AU - Treml, Ruth

AU - Kozic, Darian

AU - Zechner, Johannes

AU - Maeder, Xavier

AU - Gänser, Hans-Peter

AU - Schöngrundner, Ronald

AU - Michler, Johann

AU - Brunner, Roland

AU - Kiener, Daniel

PY - 2016

Y1 - 2016

U2 - 10.1016/j.actamat.2015.10.044

DO - 10.1016/j.actamat.2015.10.044

M3 - Article

VL - 103

SP - 616

EP - 623

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -