High resolution determination of local residual stress gradients in single- and multilayer thin film systems

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • Darian Kozic
  • Johannes Zechner
  • Xavier Maeder
  • Ronald Schöngrundner
  • Johann Michler

Organisational units

External Organisational units

  • Materials Center Leoben Forschungs GmbH
  • Eidgenössische Materialprüfanstalt, EMPA

Details

Original languageEnglish
Pages (from-to)616-623
JournalActa materialia
Volume103
DOIs
Publication statusPublished - 2016