High resolution determination of local residual stress gradients in single- and multilayer thin film systems
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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High resolution determination of local residual stress gradients in single- and multilayer thin film systems. / Treml, Ruth; Kozic, Darian; Zechner, Johannes et al.
in: Acta materialia, Jahrgang 103, 2016, S. 616-623.
in: Acta materialia, Jahrgang 103, 2016, S. 616-623.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Treml, R, Kozic, D, Zechner, J, Maeder, X, Gänser, H-P, Schöngrundner, R, Michler, J, Brunner, R & Kiener, D 2016, 'High resolution determination of local residual stress gradients in single- and multilayer thin film systems', Acta materialia, Jg. 103, S. 616-623. https://doi.org/10.1016/j.actamat.2015.10.044
APA
Treml, R., Kozic, D., Zechner, J., Maeder, X., Gänser, H.-P., Schöngrundner, R., Michler, J., Brunner, R., & Kiener, D. (2016). High resolution determination of local residual stress gradients in single- and multilayer thin film systems. Acta materialia, 103, 616-623. https://doi.org/10.1016/j.actamat.2015.10.044
Vancouver
Treml R, Kozic D, Zechner J, Maeder X, Gänser HP, Schöngrundner R et al. High resolution determination of local residual stress gradients in single- and multilayer thin film systems. Acta materialia. 2016;103:616-623. doi: 10.1016/j.actamat.2015.10.044
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Bibtex - Download
@article{4abf8481d42349609581e56312e1ca1b,
title = "High resolution determination of local residual stress gradients in single- and multilayer thin film systems",
author = "Ruth Treml and Darian Kozic and Johannes Zechner and Xavier Maeder and Hans-Peter G{\"a}nser and Ronald Sch{\"o}ngrundner and Johann Michler and Roland Brunner and Daniel Kiener",
year = "2016",
doi = "10.1016/j.actamat.2015.10.044",
language = "English",
volume = "103",
pages = "616--623",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - High resolution determination of local residual stress gradients in single- and multilayer thin film systems
AU - Treml, Ruth
AU - Kozic, Darian
AU - Zechner, Johannes
AU - Maeder, Xavier
AU - Gänser, Hans-Peter
AU - Schöngrundner, Ronald
AU - Michler, Johann
AU - Brunner, Roland
AU - Kiener, Daniel
PY - 2016
Y1 - 2016
U2 - 10.1016/j.actamat.2015.10.044
DO - 10.1016/j.actamat.2015.10.044
M3 - Article
VL - 103
SP - 616
EP - 623
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -
