Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films
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| Translated title of the contribution | Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films |
|---|---|
| Original language | English |
| Pages (from-to) | 735-742 |
| Journal | International journal of materials research : IJMR ; Zeitschrift für Metallkunde |
| Volume | 102 |
| Publication status | Published - 2011 |
