Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
Research output: Contribution to journal › Article › Research › peer-review
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Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film. / Bartosik, Matthias; Daniel, Rostislav; Mitterer, Christian et al.
In: Thin solid films, Vol. 542, 2013, p. 1-4.
In: Thin solid films, Vol. 542, 2013, p. 1-4.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Bartosik, M, Daniel, R, Mitterer, C, Matko, I, Burghammer, M, Mayrhofer, PH & Keckes, J 2013, 'Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film', Thin solid films, vol. 542, pp. 1-4. https://doi.org/10.1016/j.tsf.2013.05.102
APA
Bartosik, M., Daniel, R., Mitterer, C., Matko, I., Burghammer, M., Mayrhofer, P. H., & Keckes, J. (2013). Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film. Thin solid films, 542, 1-4. https://doi.org/10.1016/j.tsf.2013.05.102
Vancouver
Bartosik M, Daniel R, Mitterer C, Matko I, Burghammer M, Mayrhofer PH et al. Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film. Thin solid films. 2013;542:1-4. doi: 10.1016/j.tsf.2013.05.102
Author
Bibtex - Download
@article{c809485d7bfc48f193b6e7414c7eadbd,
title = "Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film",
author = "Matthias Bartosik and Rostislav Daniel and Christian Mitterer and I. Matko and M. Burghammer and P.H. Mayrhofer and Jozef Keckes",
year = "2013",
doi = "10.1016/j.tsf.2013.05.102",
language = "English",
volume = "542",
pages = "1--4",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
AU - Bartosik, Matthias
AU - Daniel, Rostislav
AU - Mitterer, Christian
AU - Matko, I.
AU - Burghammer, M.
AU - Mayrhofer, P.H.
AU - Keckes, Jozef
PY - 2013
Y1 - 2013
U2 - 10.1016/j.tsf.2013.05.102
DO - 10.1016/j.tsf.2013.05.102
M3 - Article
VL - 542
SP - 1
EP - 4
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -
