Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film

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Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film. / Bartosik, Matthias; Daniel, Rostislav; Mitterer, Christian et al.
in: Thin solid films, Jahrgang 542, 2013, S. 1-4.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{c809485d7bfc48f193b6e7414c7eadbd,
title = "Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film",
author = "Matthias Bartosik and Rostislav Daniel and Christian Mitterer and I. Matko and M. Burghammer and P.H. Mayrhofer and Jozef Keckes",
year = "2013",
doi = "10.1016/j.tsf.2013.05.102",
language = "English",
volume = "542",
pages = "1--4",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film

AU - Bartosik, Matthias

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Matko, I.

AU - Burghammer, M.

AU - Mayrhofer, P.H.

AU - Keckes, Jozef

PY - 2013

Y1 - 2013

U2 - 10.1016/j.tsf.2013.05.102

DO - 10.1016/j.tsf.2013.05.102

M3 - Article

VL - 542

SP - 1

EP - 4

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -