Critical thickness for GaN thin film on AlN substrate
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Critical thickness for GaN thin film on AlN substrate. / Coppeta, R.A.; Ceric, H; Holec, David et al.
2013. Poster session presented at International Integrated Reliability Workshop, Fallen Leaf Lake, California, United States.
2013. Poster session presented at International Integrated Reliability Workshop, Fallen Leaf Lake, California, United States.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Coppeta, RA, Ceric, H, Holec, D & Grasser, T 2013, 'Critical thickness for GaN thin film on AlN substrate', International Integrated Reliability Workshop, Fallen Leaf Lake, United States, 13/10/13 - 17/10/13.
APA
Coppeta, R. A., Ceric, H., Holec, D., & Grasser, T. (2013). Critical thickness for GaN thin film on AlN substrate. Poster session presented at International Integrated Reliability Workshop, Fallen Leaf Lake, California, United States.
Vancouver
Coppeta RA, Ceric H, Holec D, Grasser T. Critical thickness for GaN thin film on AlN substrate. 2013. Poster session presented at International Integrated Reliability Workshop, Fallen Leaf Lake, California, United States.
Author
Bibtex - Download
@conference{e1de4b64d1f942bb80bd20396280cad4,
title = "Critical thickness for GaN thin film on AlN substrate",
author = "R.A. Coppeta and H Ceric and David Holec and T. Grasser",
year = "2013",
language = "English",
note = "International Integrated Reliability Workshop ; Conference date: 13-10-2013 Through 17-10-2013",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Critical thickness for GaN thin film on AlN substrate
AU - Coppeta, R.A.
AU - Ceric, H
AU - Holec, David
AU - Grasser, T.
PY - 2013
Y1 - 2013
M3 - Poster
T2 - International Integrated Reliability Workshop
Y2 - 13 October 2013 through 17 October 2013
ER -
