Critical thickness for GaN thin film on AlN substrate
Research output: Contribution to conference › Poster › Research › peer-review
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Details
| Translated title of the contribution | Critical thickness for GaN thin film on AlN substrate |
|---|---|
| Original language | English |
| Publication status | Published - 2013 |
| Event | International Integrated Reliability Workshop - Fallen Leaf Lake, United States Duration: 13 Oct 2013 → 17 Oct 2013 |
Conference
| Conference | International Integrated Reliability Workshop |
|---|---|
| Country/Territory | United States |
| City | Fallen Leaf Lake |
| Period | 13/10/13 → 17/10/13 |
