Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Research output: Contribution to journalArticleResearchpeer-review

External Organisational units

  • PLANSEE SE
  • Erich Schmid Institute of Materials Science

Details

Original languageEnglish
Article number137480
Number of pages9
JournalThin solid films
Volume687.2019
Issue number1 October
Early online date5 Aug 2019
DOIs
Publication statusPublished - 1 Oct 2019