Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

Research output: Contribution to conference › Poster › Research › peer-review

Authors

  • H. Gabrisch
  • F. Pyczak
  • M. Rackel
  • U. Lorenz
  • N. Schell
  • A. Schreyer
  • A. Stark

Organisational units

Details

Translated title of the contributionCharacterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
Original languageEnglish
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 2013 → 30 Aug 2013

Conference

ConferenceMicroscopy Conference
Country/TerritoryGermany
CityRegensburg
Period25/08/13 → 30/08/13
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