Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

Research output: Contribution to conference › Poster › Research › peer-review

Research output: Contribution to conference › Poster › Research › peer-review

Gabrisch, H, Mayer, S, Pyczak, F, Rackel, M, Lorenz, U, Schell, N, Schreyer, A & Stark, A 2013, 'Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging', Microscopy Conference, Regensburg, Germany, 25/08/13 - 30/08/13.

Gabrisch, H., Mayer, S., Pyczak, F., Rackel, M., Lorenz, U., Schell, N., Schreyer, A., & Stark, A. (2013). Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging. Poster session presented at Microscopy Conference, Regensburg, Germany.

Gabrisch H, Mayer S, Pyczak F, Rackel M, Lorenz U, Schell N et al.. Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging. 2013. Poster session presented at Microscopy Conference, Regensburg, Germany.

@conference{32cedab59a3e4a31bb6af6086900fc71,

title = "Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging",

author = "H. Gabrisch and Svea Mayer and F. Pyczak and M. Rackel and U. Lorenz and N. Schell and A. Schreyer and A. Stark",

year = "2013",

language = "English",

note = "Microscopy Conference ; Conference date: 25-08-2013 Through 30-08-2013",

}

TY - CONF

T1 - Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

AU - Gabrisch, H.

AU - Mayer, Svea

AU - Pyczak, F.

AU - Rackel, M.

AU - Lorenz, U.

AU - Schell, N.

AU - Schreyer, A.

AU - Stark, A.

PY - 2013

Y1 - 2013

M3 - Poster

T2 - Microscopy Conference

Y2 - 25 August 2013 through 30 August 2013

ER -

Research Portal