A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
Research output: Contribution to journal › Article › Research › peer-review
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A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale. / Massl, Stefan; Keckes, Jozef; Pippan, Reinhard.
In: Acta materialia, Vol. 55, 2007, p. 4835-4844.
In: Acta materialia, Vol. 55, 2007, p. 4835-4844.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Massl, S, Keckes, J & Pippan, R 2007, 'A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale', Acta materialia, vol. 55, pp. 4835-4844.
APA
Massl, S., Keckes, J., & Pippan, R. (2007). A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale. Acta materialia, 55, 4835-4844.
Vancouver
Massl S, Keckes J, Pippan R. A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale. Acta materialia. 2007;55:4835-4844.
Author
Bibtex - Download
@article{5da523d5012342689b5fa685385a9d3d,
title = "A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale",
author = "Stefan Massl and Jozef Keckes and Reinhard Pippan",
year = "2007",
language = "English",
volume = "55",
pages = "4835--4844",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
AU - Massl, Stefan
AU - Keckes, Jozef
AU - Pippan, Reinhard
PY - 2007
Y1 - 2007
M3 - Article
VL - 55
SP - 4835
EP - 4844
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -
