A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale. / Massl, Stefan; Keckes, Jozef; Pippan, Reinhard.
in: Acta materialia, Jahrgang 55, 2007, S. 4835-4844.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{5da523d5012342689b5fa685385a9d3d,
title = "A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale",
author = "Stefan Massl and Jozef Keckes and Reinhard Pippan",
year = "2007",
language = "English",
volume = "55",
pages = "4835--4844",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale

AU - Massl, Stefan

AU - Keckes, Jozef

AU - Pippan, Reinhard

PY - 2007

Y1 - 2007

M3 - Article

VL - 55

SP - 4835

EP - 4844

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -