Yue Hou
(Former)
Research output
- 2010
- Published
Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Schloffer, M., Teichert, C., Supancic, P., Andreev, A., Hou, Y. & Wang, Z., 2010, In: Journal of the European Ceramic Society. 30, p. 1761-1764Research output: Contribution to journal › Article › Research › peer-review
- Published
Scanning Probe Microscopy-based Characterization of ZnO Nanorods
Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- 2007
- Published
Characterization of ZnO nanorods by AFM
Hou, Y., Andreev, A., Teichert, C., Brauer, G. & Djutisic, A., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of piezo ceramics on the nanoscale by Conducting AFM
Hou, Y., Andreev, A. & Teichert, C., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of vertical arrays of ZnO nanorod by AFM
Hou, Y., Andreev, A., Teichert, C., Brauer, G., Tam, K. H. & Djuricis, A., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample 905041041Ksp
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample TN06-363
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample TN0648801
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample halt4714
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review