Tobias Ziegelwanger
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Research output
- Published
Backside metallization affects residual stress and bending strength of the recast layer in laser-diced Si
Ziegelwanger, T., Reisinger, M., Matoy, K., Medjahed, A. A., Zalesak, J., Gruber, M., Meindlhumer, M. & Keckes, J., Oct 2024, In: Materials Science in Semiconductor Processing. 181, 108579.Research output: Contribution to journal › Article › Research › peer-review
- Published
Anisotropy of fracture toughness in nanostructured ceramics controlled by grain boundary design
Daniel, R., Meindlhumer, M., Baumegger, W., Todt, J., Zalesak, J., Ziegelwanger, T., Mitterer, C. & Keckes, J., 2019, In: Materials and Design. 161.2019, January, p. 80-85 6 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates
Ziegelwanger, T., Reisinger, M., Vedad, B., Hlushko, K., Van Petegem, S., Todt, J., Meindlhumer, M. & Keckes, J., 31 Jan 2025, In: Materials and Design. 251.2025, March, 9 p., 113664.Research output: Contribution to journal › Article › Research › peer-review
