Stefan Karner

(Former)

Research output

  1. 2019
  2. Published
  3. 2022
  4. Published

    Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs

    Karner, S., Blank, O., Rösch, M., Zalesak, J., Keckes, J. & Gammer, C., 2022, In: Microelectronic engineering. 264.2022, 15 August, 111870.

    Research output: Contribution to journalArticleResearchpeer-review

  5. E-pub ahead of print

    X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors

    Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.

    Research output: Contribution to journalArticleResearchpeer-review

  6. 2023
  7. Published