Stefan Karner

(Former)

Research output

  1. 2023
  2. Published
  3. 2022
  4. E-pub ahead of print

    X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors

    Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs

    Karner, S., Blank, O., Rösch, M., Zalesak, J., Keckes, J. & Gammer, C., 2022, In: Microelectronic engineering. 264.2022, 15 August, 111870.

    Research output: Contribution to journalArticleResearchpeer-review

  6. 2019
  7. Published