Rostislav Daniel
161 - 164 out of 164Page size: 10
Research output
- Published
Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Riedl, A., Daniel, R., Todt, J., Steffenelli, M., Holec, D., Sartory, B., Krywka, C., Müller, M., Mitterer, C. & Keckes, J., 2014, In: Surface & coatings technology. 257, p. 108-113Research output: Contribution to journal › Article › Research › peer-review
- Published
Accurate prediction of structural and mechanical properties on amorphous materials enabled through machine-learning potentials: A case study of silicon nitride
Nayak, G. K., Srinivasan, P., Todt, J., Daniel, R., Nicolini, P. & Holec, D., 6 Jan 2025, In: Computational materials science. 249.2025, 5 February, 11 p., 113629.Research output: Contribution to journal › Article › Research › peer-review
- Published
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873Research output: Contribution to journal › Article › Research › peer-review
