Rostislav Daniel
Research output
- Published
Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Klaus, M., Genzel, C., Mitterer, C. & Keckes, J., 2010, In: Thin solid films. 518, 8, p. 2090-2096Research output: Contribution to journal › Article › Research › peer-review
- Published
Residual stresses in thermally cycled CrN coatings on steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C. & Keckes, J., 2008, In: Thin solid films. 517, p. 1167-1171Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751Research output: Contribution to journal › Article › Research › peer-review
- Published
Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin films
Keckes, J., Daniel, R., Mitterer, C., Matko, I., Sartory, B., Köpf, A., Weißenbacher, R. & Pitonak, R., 2013, In: Thin solid films. 545, p. 29-32Research output: Contribution to journal › Article › Research › peer-review
- Published
Novel TiAlN nanostructured CVD coatings with superior oxidation resistance
Keckes, J., Todt, J., Daniel, R., Mitterer, C., Köpf, A., Weißenbacher, R. & Pitonak, R., 2013.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
Keckes, J., Daniel, R., Bartosik, M., Mitterer, C., Schoeder, S. & Burghammer, M., 2011, Proceeding of International Conference on Metallurgical Coatings and Thin Films. p. 55-55Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method
Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R. & Mitterer, C., 2007, In: Review of scientific instruments. 78, p. 036103-01-036103-03Research output: Contribution to journal › Article › Research › peer-review
- Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.Research output: Contribution to conference › Poster › Research › peer-review
