Roland Brunner
(Former)
Research output
- Published
Young's Modulus and Poisson's Ratio Characterization of Tungsten Thin Films via Laser Ultrasound
Grünwald, E., Nuster, R., Treml, R., Kiener, D., Paltauf, G. & Brunner, R., 2015, In: Materials Today: Proceedings. 2, p. 4289-4294Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks
Grünwald, E., Nuster, R., Paltauf, G., Maier, T., Wimmer-Teubenbacher, R., Konetschnik, R., Kiener, D., Leitgeb, V., Köck, A. & Brunner, R., 19 Sept 2017, (E-pub ahead of print) In: Materials Today: Proceedings. 4.2017, 7, Part 2, p. 7122-7127 6 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Determination of residual stresses and fracture properties on a local scale
Kiener, D., Treml, R., Kozic, D., Brunner, R., Keckes, J. & Zechner, J., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
How Residual Stresses Affect the Fracture Properties of Layered Thin Films
Kiener, D., Treml, R., Kozic, D., Zalesak, J., Zechner, J., Keckes, J., Schöngrundner, R., Gänser, H.-P. & Brunner, R., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Influence of Residual Stresses on the Fracture Properties of Multilayer Films
Kiener, D., Treml, R., Kozic, D., Zechner, J., Maeder, X., Schöngrundner, R. & Brunner, R., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- E-pub ahead of print
Miniaturized fracture experiments to determine the toughness of individual films in a multilayer system
Konetschnik, R., Kozic, D., Schöngrundner, R., Kolednik, O., Gänser, H.-P., Brunner, R. & Kiener, D., 25 Jan 2016, (E-pub ahead of print) In: Extreme Mechanics Letters. 8.2016, September, p. 235-244 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Residual Stress Investigations in Thin Film Systems: Experiment and Simulation
Kozic, D., Treml, R., Sartory, B., Schöngrundner, R., Kiener, D., Antretter, T., Gänser, H.-P. & Brunner, R., 2014.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Evaluation of the residual stress distribution in thin films by means of the ion beam layer removal method
Kozic, D., Treml, R., Schöngrundner, R., Brunner, R., Kiener, D., Antretter, T. & Gänser, H.-P., 2014, Proceedings of the 15th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems EuroSimE 2014. Zhang, G. Q., Van Driel, W. D., Rodgers, P., Bailey, C. & de Saint Leger, O. (eds.). Institute of Electrical and Electronics Engineers, 6813785Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Fracture mechanics of thin film systems on the sub-micron scale
Kozic, D., Treml, R., Schongrundner, R., Brunner, R., Kiener, D., Zechner, J., Antretter, T. & Ganser, H. P., 6 May 2015, 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015. Institute of Electrical and Electronics Engineers, 7103088Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Fracture and Material Behavior of Thin Film composites
Kozic, D., Konetschnik, R., Maier-Kiener, V., Schöngrundner, R., Brunner, R., Kiener, D., Antretter, T. & Gänser, H.-P., 2016, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) . Institute of Electrical and Electronics Engineers, p. 1-6 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
