Paul Angerer
(Former)
1 - 3 out of 3Page size: 10
Research output
- 2020
- Published
Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis
Wiessner, M., Angerer, P., van der Zwaag, S. & Gamsjäger, E., 25 Dec 2020, In: Materials characterization. 172.2021, February, 9 p., 110860.Research output: Contribution to journal › Article › Research › peer-review
- 2016
- E-pub ahead of print
Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures
Angerer, P., Schöngrundner, R., Macurova, K., Wießner, M. & Keckes, J., 28 Sept 2016, (E-pub ahead of print) In: Powder diffraction. 31.2016, 4, p. 267-273 7 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Thermal stability of residual stresses in Ti-6Al-4V components
Stanojevic, A., Angerer, P. & Oberwinkler, B., 14 Apr 2016, In: IOP Conference Series: Materials Science and Engineering. 119, 1, 012007.Research output: Contribution to journal › Conference article › peer-review
