Matthias Bartosik
Research output
- Published
Is it meaningful to quantify vacancy concentrations of nanolamellar (Ti,Al)N thin films based on laser-assisted atom probe data?
Hans, M., Tkadletz, M., Primetzhofer, D., Waldl, H., Schiester, M., Bartosik, M., Czettl, C., Schalk, N., Mitterer, C. & Schneider, J. M., 25 Nov 2023, In: Surface & coatings technology. 473.2023, 25 November, 11 p., 130020.Research output: Contribution to journal › Article › Research › peer-review
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X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751Research output: Contribution to journal › Article › Research › peer-review
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Mechanical properties of CrN-based superlattices: Impact of magnetism
Löfler, L., Hahn, R., Mayrhofer, P. H., Bartosik, M. & Holec, D., 1 Oct 2021, In: Acta materialia. 218.2021, 1 October, 13 p., 117095.Research output: Contribution to journal › Article › Research › peer-review
- Published
Macroscopic fracture behaviour of CrN hard coatings evaluated by X-ray diffraction coupled with four-point bending
Stefenelli, M., Riedl, A., Todt, J., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 1 Jan 2014, Materials Science Forum. Vol. 768-769. p. 272-279 8 p. (Materials Science Forum; vol. 768-769).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Thermally treated hard coatings characterized by XRD coupled with four-point bending
Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction
Todt, J., Krywka, C., Zhang, Z. L., Mayrhofer, P. H., Keckes, J. & Bartosik, M., 29 May 2020, In: Acta Materialia. 195.2020, 15 August, p. 425-432 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Enhanced fracture toughness in ceramic superlattice thin films: On the role of coherency stresses and misfit dislocations
Wagner, A., Holec, D., Mayrhofer, P. H. & Bartosik, M., Apr 2021, In: Materials and Design. 2021, 202, 10 p., 109517.Research output: Contribution to journal › Article › Research › peer-review
- Published
Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film
Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H. & Keckes, J., 2016, In: Acta materialia. 102, p. 212-219 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Direct observation of crack arrest after bridge notch failure: A strategy to increase statistics and reduce FIB-artifacts in micro-cantilever testing
Zhang, Y., Bartosik, M., Brinckmann, S., Lee, S. & Kirchlechner, C., Sept 2023, In: Materials and Design. 233.2023, September, 7 p., 112188.Research output: Contribution to journal › Article › Research › peer-review