Karl Christian Teichert
Research output
- 2009
- Published
Bildungsmechanismen und Quanteneffekte in Ge-Quantendots auf Si(001) und Si(111)
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Characterization of single ZnO nanorods by conductive atomic force microscopy
Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G. & Anwand, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of single ZnO nanorods by conductive atomic microscopy
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Charcterization of kraft pulp fiber surfaces using atomic force microscopy
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Comparative AFM and SEM investigations on kraft pulp fiber surfaces
Schmied, F., Teichert, C., Kappel, L., Hirn, U., Schennach, R. & Schröttner, H., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive Atomic Force Microscopy investigations of organic thin films
Pavitschitz, A., Beinik, I., Kratzer, M., Teichert, C., Schwabegger, G., Sitter, H., Simbrunner, C., Grießer, T. & Kern, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3Research output: Contribution to journal › Article › Research › peer-review
- Published
Defektbildung und Ladungsträgereinfang in epitaktisch gewachsenen organischen Nanostrukturen
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Ehrlich Schwoebel barriers in organic thin film growth
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Elektrische Eigenschaften von Dünnfilmen auf der Nanoskala
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Exploring fundamental growth morphologies in organic thin film systems
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Hierarchy of adhesion forces in patterns of photoreactive surface layers
Hlawacek, G., Shen, Q., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2009, In: Journal of chemical physics (The journal of chemical physics). 130, p. 44703-1-44703-5Research output: Contribution to journal › Article › Research › peer-review
- Published
High Resolution RBS on High-k Dielectrics
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
Teichert, C. (Editor), 2009, Eigenverlag.Research output: Book/Report › Anthology › Research
- Published
Ion beam sputtered nanostructured semiconductor surfaces as templates for nanomagnet arrays
Teichert, C., de Miguel, J. J. & Bobek, T., 2009, In: Journal of physics (Condensed matter). 21, p. 224025-224033Research output: Contribution to journal › Article › Research › peer-review
- Published
Ion-bombardment induced morphology change of device related SiGe multilayer heterostructures
Hofer, C., Teichert, C., Werner, J., Lyutovich, K. & Kasper, E., 2009, In: Applied surface science. 256, p. 267-273Research output: Contribution to journal › Article › Research › peer-review
- Published
Kontaktwinkelmessung an UHPC Oberflächen
Schmied, F., Gürkan, N. & Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
