Karl Christian Teichert
Research output
- Published
Oligophenyl thin films for Organic Field Effect Transistors
Andreev, A., Hlawacek, G., Sitter, H., Winkler, A., Ramsey, M., Resel, R., Teichert, C. & Sariciftci, N. S., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of semiconducting nanorods by AFM and conducting AFM
Andreev, A., Hou, Y. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Single-crystalline nanoribbon network field effect transistors from arbitrary two-dimensional materials
Aslam, M. A., Tran, T. H., Supina, A., Siri, O., Meunier, V., Watanabe, W., Taniguchi, T., Kralj, M., Teichert, C., Sheremet, E., Rodriguez, R. D. & Matkovic, A., 31 Oct 2022, In: npj 2D materials and applications. 2022, 1, 9 p., 76.Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm
Beinik, I. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
