Igor Beinik

(Former)

1 - 10 out of 28Page size: 10

Research output

  1. Published

    Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  2. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm

    Beinik, I. & Teichert, C., 2011

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  5. Published

    Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures

    Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Photoresponse from single upright standing ZnO nanorods explored by photoconductive atomic force microscopy

    Beinik, I., Kratzer, M., Teichert, C., Wachauer, A., Wang, L., Pyriatinsky, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurisic, A., 2013, In: Beilstein journal of nanotechnology . 4, p. 208-217

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Electrical Characterization of Semiconductor Nanostructures by Conductive Probe Based Atomic Force Microscopy Techniques

    Beinik, I., 2011, 118 p.

    Research output: Thesis › Doctoral Thesis

  10. Published

    Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Piryatinski, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F., Djurišić, A. B. & Teichert, C., 17 Apr 2013, In: Beilstein journal of nanotechnology. 4, 1, p. 208-217 10 p.

    Research output: Contribution to journal › Article › Research › peer-review

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