Friedemar Kuchar
Research output
- Published
Damage of basalt induced by microwave irradiation
Hartlieb, P., Leindl, M., Kuchar, F., Antretter, T. & Moser, P., 2012, In: Minerals engineering. p. 82-89Research output: Contribution to journal › Article › Research › peer-review
- Published
The relation of temperature, microwave absorbing properties and thermo - dynamic behavior of selected hard rocks
Hartlieb, P., Toifl, M., Meisels, R., Antretter, T. & Kuchar, F., 11 Jun 2015, Physical Separation 15 - Proceedings.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
The relation of temperature, microwave absorbing properties and thermo-dynamic properties of selected hard rocks
Hartlieb, P., Toifl, M., Meisels, R., Antretter, T. & Kuchar, F., 11 Jun 2015.Research output: Contribution to conference › Presentation › Research
- Published
Thermo-physical properties of selected hard rocks and their relation to microwave-assisted comminution
Hartlieb, P., Toifl, M., Kuchar, F., Meisels, R. & Antretter, T., 2016, In: Minerals engineering. 91.2016, p. 34 - 41 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Reaction of different rock types to low-power (3.2 kW) microwave irradiation in a multimode cavity
Hartlieb, P., Kuchar, F., Moser, P., Kargl, H. & Restner, U., Jan 2018, In: Minerals engineering. 118Research output: Contribution to journal › Article › Research › peer-review
- Published
Dynamical scaling of the quantum Hall plateau transition
Hohls, F., Zeitler, U., Haug, R., Meisels, R., Dybko, K. & Kuchar, F., 2002, In: Physical review letters. 89, p. 2768011-2768014Research output: Contribution to journal › Article › Research › peer-review
- Published
A generalized treatment of the dynamical scaling of the quantum Hall effect plateau transition
Hohls, F., Zeitler, U., Haug, R., Meisels, R., Dybko, K. & Kuchar, F., 2003, In: Physica E: Low-dimensional systems & nanostructures. p. 10-16Research output: Contribution to journal › Article › Research › peer-review
- Published
Hydrogen content in amorphous SiN
Jonak, I. & Kuchar, F., 2000, In: European semiconductor. 22, p. 49-52Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of silicon gate oxides by conducting atomic-force microscopy
Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172Research output: Contribution to journal › Article › Research › peer-review
- Published
Modification and characterization of thin silicon gate oxides using conducting atomic force microscopy
Kremmer, S., Peissl, S., Teichert, C., Kuchar, F. & Hofer, C., 2003, In: Materials science and engineering B (Solid-state materials for advanced technology). 102, p. 88-93Research output: Contribution to journal › Article › Research › peer-review
