Daniel Kiener
Research output
- 2006
- Published
In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism
Oh, S. H., Kiener, D., Legros, M., Gruber, P., Arzt, E. & Dehm, G., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Micron beam bending and compression tests - micromechanical properties of copper
Motz, C., Kiener, D., Schöberl, T. & Dehm, G., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Microstructural evolution of the deformed volume beneath microindents in tungsten and copper
Kiener, D., Pippan, R., Motz, C. & Kreuzer, E., 2006, In: Acta materialia. 54, p. 2801-2811Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructural investigation of the deformation zone below nanoindents in copper, silver and nickel
Rester, M., Kiener, D., Kreuzer, H., Dehm, G. & Motz, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- 2005
- Published
Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik
Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 162-163Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Fracture toughness investigations of tungsten alloys and severe plastic deformed tungsten alloys
Faleschini, M., Kiener, D., Knabl, W. & Pippan, R., 2005, International PLANSEE Seminar. p. 701-711Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Fracture toughness investigations of tungsten alloys and severe plastic deformed tungsten alloys
Faleschini, M., Kiener, D., Knabl, W. & Pippan, R., 2005.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Microstructural characterization of deformed volume beneath microindentaions
Motz, C., Kiener, D., Kreuzer, H., Prantl, W. & Pippan, R., 2005, Microstructural characterization of deformed volume beneath microindentaions. p. 459-464Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Sekundärionen-Massensprektroskopie (SIMS) mittels FIB
Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 199-200Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- 2004
- Published
Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM
Motz, C., Kiener, D., Kreuzer, H., Prantl, W. & Pippan, R., 2004, Proceedings of the 25th Risø International Symposium on Materials Science: Evolution of Deformation Microstructures in 3D. p. 459-464Research output: Chapter in Book/Report/Conference proceeding › Conference contribution