Department Physics, Mechanics and Electrical Engineering
Organisational unit: Departments and Institutes
Research output
- Published
Growth of ultra-thin para-hexaphenyl layers on atomically-flat TiO2(110) surfaces
Belza, W., Szajna, K., Wrana, D., Kratzer, M., Teichert, C. & Krok, F., 25 Feb 2018.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Molecular Structure and Electronic Properties of para-Hexaphenyl Monolayer on Atomically Flat Rutile TiO2(110)
Belza, W., Szajna, K., Kratzer, M., Wrana, D., Cieslik, K., Krawiec, M., Teichert, C. & Krok, F., 12 Mar 2020, In: Journal of Physical Chemistry C. 124.2020, 10, p. 5681-5689 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Visible light emission in graphene field effect transistors
Beltaos, A., Johan Bergren1, A., Bosnick, K., Pekas, N., Lane, S., Cui, K., Matkovic, A. & Meldrum, A., 28 Sept 2017, In: Nano Futures. 1.2017, 2, 11 p., 025004.Research output: Contribution to journal › Article › Research › peer-review
- Published
Millimeterwave-Conductivity Experiments regarding Dynamical Scaling of the Integer Quantum Hall Effect
Belitsch, W., Meisels, R., Kuchar, F., Hein, G. & Pierz, K., 1998, In: Physica B: Condensed Matter. 249-251, p. 199-202Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm
Beinik, I. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
