Department Physics, Mechanics and Electrical Engineering
Organisational unit: Departments and Institutes
Research output
- Published
Adsorption-Induced Deformation of Hierarchically Structured Mesoporous Silica Effect of Pore-Level Anisotropy
Balzer, C., Waag, A., Gehret, S., Reichenauer, G., Putz, F., Hüsing, N., Paris, O., Bernstein, N., Gor, G. Y. & Neimark, A. V., 6 Jun 2017, In: Langmuir. 33.2017, 22, p. 5592-5602 11 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Mechanical Characterization of Hierarchical Structured Porous Silica by in Situ Dilatometry Measurements during Gas Adsorption
Balzer, C., Waag, A. M., Putz, F., Huesing, N., Paris, O., Gor, G. Y., Neimark, A. V. & Reichenauer, G., 26 Feb 2019, In: Langmuir. 35.2019, 8, p. 2948-2956 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
CONTROL OF CARRIER LIFETIMES IN PBTE DOPING SUPERLATTICES
Bauer, G., Oswald, J., Goltsos, W. & Nurmikko, A., 1988, In: Journal of applied physics. 63, p. 2179-2181Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm
Beinik, I. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
