Chair of Materials Physics (430)
Organisational unit: Chair
Research output
- Published
Zehn hochdotierte EU-Förderpreise
Kiener, D., 28 Nov 2017Research output: Non-textual form › Web publication/site › Transfer
- Published
Young's Modulus and Poisson's Ratio Characterization of Tungsten Thin Films via Laser Ultrasound
Grünwald, E., Nuster, R., Treml, R., Kiener, D., Paltauf, G. & Brunner, R., 2015, In: Materials Today: Proceedings. 2, p. 4289-4294Research output: Contribution to journal › Article › Research › peer-review
- Published
Yield and plastic flow of soft metals in small volumes loaded in tension and flexure
Dunstan, D. J., Gallé, J. U., Hou, X. D., P'ng, K. M. Y., Bushby, A. J., Yang, B. & Kiener, D., 2012, In: Philosophical magazine. 92, p. 3199-3215Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31Research output: Contribution to journal › Article › Research › peer-review
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X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751Research output: Contribution to journal › Article › Research › peer-review
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X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors
Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods
Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073Research output: Contribution to journal › Article › Research › peer-review
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X-ray Diffraction Computed Nanotomography Applied to Solve the Structure of Hierarchically Phase-Separated Metallic Glass
Stoica, M., Sarac, B., Spieckermann, F., Wright, J., Gammer, C., Han, J., Gostin, P. F., Eckert, J. & Löffler, J. F., 29 Jan 2021, In: ACS nano. 15.2021, 2, p. 2386-2398 13 p.Research output: Contribution to journal › Article › Research › peer-review
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X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
