Microscopy and microanalysis, ‎1431-9276

Journal

ISSNs1431-9276

Research output

  1. 2012
  2. Published

    Connecting in situ TEM mechanical testing with bulk properties of irradiated materials

    Minor, A. M., Hosemann, P. & Kiener, D., 2012, In: Microscopy and microanalysis. 18, p. 1344-1345

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Quantitative Approaches for in situ SEM and TEM Deformation Studies

    Dehm, G., Kiener, D., Motz, C., Pippan, R. & Smolka, M., 2012, In: Microscopy and microanalysis. 18, p. 736-737

    Research output: Contribution to journalArticleResearchpeer-review

  4. 2011
  5. Published
  6. 2010
  7. Published

    Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing

    Lowry, M. B., Kiener, D., Le Blanc, B. B., Chisholm, C., Florando, J. N., Morris, J. W. J. & Minor, A. M., 2010, In: Microscopy and microanalysis. 16, p. 1748-1749

    Research output: Contribution to journalArticleResearchpeer-review

  8. 2009
  9. Published

    Sensitivity and Quantitativity in Atom Probe Tomography

    Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M. & Danoix, R., 2009, In: Microscopy and microanalysis. p. 258-259

    Research output: Contribution to journalArticleResearchpeer-review

  10. 2007
  11. Published

    Conventional TEM investigation of the FIB damage in copper

    Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101

    Research output: Contribution to journalArticleResearchpeer-review

  12. Published

    Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide

    Oh, S. H., Legros, M., Kiener, D., Gruber, P. A. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 278-279

    Research output: Contribution to journalArticleResearchpeer-review

  13. 2003
  14. Published

    Quantification of the Recrystallized Fraction in a Nickel-Base-Alloy from EBSD data

    Mitsche, S., Pölt, P., Sommitsch, C. & Walter, M., 2003, In: Microscopy and microanalysis. Suppl. 3, p. 344-345

    Research output: Contribution to journalArticleResearchpeer-review

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