Journal of applied crystallography, ‎0021-8898

Journal

ISSNs0021-8898, 1600-5767
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Research output

  1. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journal › Article › Research › peer-review

  2. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Two-dimensional indirect Fourier transformation for evaluation of small-angle scattering data of oriented samples

    Fritz-Popovski, G., 2013, In: Journal of applied crystallography. 46, p. 1447-1454

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Symmetry properties and transformation behaviour of the X-ray stress factors

    Ortner, B., 2006, In: Journal of applied crystallography. 39, p. 401-409

    Research output: Contribution to journal › Article › Research › peer-review

  5. Published

    Simultaneous determination of experimental elastic and thermal strains in thin films

    Keckes, J., 2005, In: Journal of applied crystallography. 38, p. 311-318

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Separation of scattering contributions from carbides and gamma' precipitates in Nimonic 80a by combining small-angle X-ray and neutron scattering

    Zickler, G., Tian, B., Lind, C. & Paris, O., 2003, In: Journal of applied crystallography. 36, p. 484-488

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Scanning small-angle X-ray scattering analysis of the size and organization of the mineral nanoparticles in fluorotic bone using a stack of cards model

    Gourrier, A., Li, C., Siegel, S., Paris, O., Roschger, P., Klaushofer, K. & Fratzl, P., 2010, In: Journal of applied crystallography. 43, p. 1385-1392

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer

    Benediktovitch, A. I., Ulyanenkova, T., Keckes, J. & Ulyanenkov, A. P., 2014, In: Journal of applied crystallography. p. 1931-938

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Rapid determination of stress factors and absolute residual stresses in thin films

    Martinschitz, K. J., Eiper, E., Massl, S., Köstenbauer, H., Daniel, R., Fontalvo, G., Mitterer, C. & Keckes, J., 2006, In: Journal of applied crystallography. 39, p. 777-783

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Quantifying adsorption-induced deformation of nanoporous materials on different length scales

    Morak, R., Braxmeier, S., Ludescher, L., Putz, F., Busch, S., Hüsing, N., Reichenauer, G. & Paris, O., 2017, In: Journal of applied crystallography. 50.2017, p. 1404-1410 7 p., 5.

    Research output: Contribution to journal › Article › Research › peer-review

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