Thermography and complementary measurements as tools to detect micro-irregularities in electronic components
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in: Journal of ceramic science and technology, Jahrgang 6, Nr. 4, 12.2015, S. 255-260.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Thermography and complementary measurements as tools to detect micro-irregularities in electronic components
AU - Röhrig, S.
AU - Petschenig, I.
AU - Bermejo, R.
AU - Hofstätter, M.
AU - Aldrian, F.
AU - Danzer, R.
AU - Supancic, P.
PY - 2015/12
Y1 - 2015/12
KW - Electroceramics
KW - Focused ion beam
KW - Inhomogeneities
KW - LTCC
KW - Microthermography
KW - PTC
UR - http://www.scopus.com/inward/record.url?scp=84954446327&partnerID=8YFLogxK
U2 - 10.4416/JCST2015-00052
DO - 10.4416/JCST2015-00052
M3 - Article
AN - SCOPUS:84954446327
VL - 6
SP - 255
EP - 260
JO - Journal of ceramic science and technology
JF - Journal of ceramic science and technology
SN - 2190-9385
IS - 4
ER -
