Thermography and complementary measurements as tools to detect micro-irregularities in electronic components

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Thermography and complementary measurements as tools to detect micro-irregularities in electronic components. / Röhrig, S.; Petschenig, I.; Bermejo, R. et al.
In: Journal of ceramic science and technology, Vol. 6, No. 4, 12.2015, p. 255-260.

Research output: Contribution to journal › Article › Research › peer-review

Harvard

Röhrig, S, Petschenig, I, Bermejo, R, Hofstätter, M, Aldrian, F, Danzer, R & Supancic, P 2015, 'Thermography and complementary measurements as tools to detect micro-irregularities in electronic components', Journal of ceramic science and technology, vol. 6, no. 4, pp. 255-260. https://doi.org/10.4416/JCST2015-00052

APA

Röhrig, S., Petschenig, I., Bermejo, R., Hofstätter, M., Aldrian, F., Danzer, R., & Supancic, P. (2015). Thermography and complementary measurements as tools to detect micro-irregularities in electronic components. Journal of ceramic science and technology, 6(4), 255-260. https://doi.org/10.4416/JCST2015-00052

Vancouver

Röhrig S, Petschenig I, Bermejo R, Hofstätter M, Aldrian F, Danzer R et al. Thermography and complementary measurements as tools to detect micro-irregularities in electronic components. Journal of ceramic science and technology. 2015 Dec;6(4):255-260. doi: 10.4416/JCST2015-00052

Author

Röhrig, S. ; Petschenig, I. ; Bermejo, R. et al. / Thermography and complementary measurements as tools to detect micro-irregularities in electronic components. In: Journal of ceramic science and technology. 2015 ; Vol. 6, No. 4. pp. 255-260.

Bibtex - Download

@article{38bf5ca75da342a584597e35e6e40ead,
title = "Thermography and complementary measurements as tools to detect micro-irregularities in electronic components",
keywords = "Electroceramics, Focused ion beam, Inhomogeneities, LTCC, Microthermography, PTC",
author = "S. R{\"o}hrig and I. Petschenig and R. Bermejo and M. Hofst{\"a}tter and F. Aldrian and R. Danzer and P. Supancic",
year = "2015",
month = dec,
doi = "10.4416/JCST2015-00052",
language = "English",
volume = "6",
pages = "255--260",
journal = "Journal of ceramic science and technology",
issn = "2190-9385",
publisher = "Goeller Verlag GmbH",
number = "4",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Thermography and complementary measurements as tools to detect micro-irregularities in electronic components

AU - Röhrig, S.

AU - Petschenig, I.

AU - Bermejo, R.

AU - Hofstätter, M.

AU - Aldrian, F.

AU - Danzer, R.

AU - Supancic, P.

PY - 2015/12

Y1 - 2015/12

KW - Electroceramics

KW - Focused ion beam

KW - Inhomogeneities

KW - LTCC

KW - Microthermography

KW - PTC

UR - http://www.scopus.com/inward/record.url?scp=84954446327&partnerID=8YFLogxK

U2 - 10.4416/JCST2015-00052

DO - 10.4416/JCST2015-00052

M3 - Article

AN - SCOPUS:84954446327

VL - 6

SP - 255

EP - 260

JO - Journal of ceramic science and technology

JF - Journal of ceramic science and technology

SN - 2190-9385

IS - 4

ER -

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