Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

Temperature dependence of residual stresses in thin films determined by the substrate curvatur method. / Eiper, Ernst; Martinschitz, Klaus-Jürgen; Köstenbauer, Harald et al.
2006. Postersitzung präsentiert bei 7th European Conference Residual Stresses ECRS7, Berlin, Deutschland.

Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

Eiper, E, Martinschitz, K-J, Köstenbauer, H, Massl, S & Keckes, J 2006, 'Temperature dependence of residual stresses in thin films determined by the substrate curvatur method', 7th European Conference Residual Stresses ECRS7, Berlin, Deutschland, 13/09/06 - 15/09/06.

Eiper, E., Martinschitz, K.-J., Köstenbauer, H., Massl, S., & Keckes, J. (2006). Temperature dependence of residual stresses in thin films determined by the substrate curvatur method. Postersitzung präsentiert bei 7th European Conference Residual Stresses ECRS7, Berlin, Deutschland.

Eiper E, Martinschitz KJ, Köstenbauer H, Massl S, Keckes J. Temperature dependence of residual stresses in thin films determined by the substrate curvatur method. 2006. Postersitzung präsentiert bei 7th European Conference Residual Stresses ECRS7, Berlin, Deutschland.

Eiper, Ernst ; Martinschitz, Klaus-Jürgen ; Köstenbauer, Harald et al. / Temperature dependence of residual stresses in thin films determined by the substrate curvatur method. Postersitzung präsentiert bei 7th European Conference Residual Stresses ECRS7, Berlin, Deutschland.

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title = "Temperature dependence of residual stresses in thin films determined by the substrate curvatur method",

author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Harald K{\"o}stenbauer and Stefan Massl and Jozef Keckes",

year = "2006",

language = "English",

note = "7th European Conference Residual Stresses ECRS7 ; Conference date: 13-09-2006 Through 15-09-2006",

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TY - CONF

T1 - Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

AU - Eiper, Ernst

AU - Martinschitz, Klaus-Jürgen

AU - Köstenbauer, Harald

AU - Massl, Stefan

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Poster

T2 - 7th European Conference Residual Stresses ECRS7

Y2 - 13 September 2006 through 15 September 2006

ER -

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