Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Standard

Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods. / Martinschitz, Klaus-Jürgen; Eiper, Ernst; Keckes, Jozef.
in: Materials Science Forum , Jahrgang 524-525, 2006, S. 711-715.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{52ba54d4c8ed4493a8478cf4ba27df67,
title = "Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods",
author = "Klaus-J{\"u}rgen Martinschitz and Ernst Eiper and Jozef Keckes",
year = "2006",
language = "English",
volume = "524-525",
pages = "711--715",
journal = "Materials Science Forum ",
issn = "0255-5476",
publisher = "Trans Tech Publications",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods

AU - Martinschitz, Klaus-Jürgen

AU - Eiper, Ernst

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Article

VL - 524-525

SP - 711

EP - 715

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

ER -