Separation of Universal and Non-Universal Scaling Regions in the IQHE

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Separation of Universal and Non-Universal Scaling Regions in the IQHE. / Meisels, R; Kuchar, Friedemar; Belitsch, W et al.
in: Microelectronic engineering, Jahrgang 47, 1999, S. 23-25.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{ddb988305d584e12a00fff46aab8544f,
title = "Separation of Universal and Non-Universal Scaling Regions in the IQHE",
author = "R Meisels and Friedemar Kuchar and W Belitsch and B Kramer",
year = "1999",
language = "English",
volume = "47",
pages = "23--25",
journal = "Microelectronic engineering",
issn = "0167-9317",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Separation of Universal and Non-Universal Scaling Regions in the IQHE

AU - Meisels, R

AU - Kuchar, Friedemar

AU - Belitsch, W

AU - Kramer, B

PY - 1999

Y1 - 1999

M3 - Article

VL - 47

SP - 23

EP - 25

JO - Microelectronic engineering

JF - Microelectronic engineering

SN - 0167-9317

ER -