Separation of Universal and Non-Universal Scaling Regions in the IQHE
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Separation of Universal and Non-Universal Scaling Regions in the IQHE. / Meisels, R; Kuchar, Friedemar; Belitsch, W et al.
in: Microelectronic engineering, Jahrgang 47, 1999, S. 23-25.
in: Microelectronic engineering, Jahrgang 47, 1999, S. 23-25.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Meisels, R, Kuchar, F, Belitsch, W & Kramer, B 1999, 'Separation of Universal and Non-Universal Scaling Regions in the IQHE', Microelectronic engineering, Jg. 47, S. 23-25.
APA
Meisels, R., Kuchar, F., Belitsch, W., & Kramer, B. (1999). Separation of Universal and Non-Universal Scaling Regions in the IQHE. Microelectronic engineering, 47, 23-25.
Vancouver
Meisels R, Kuchar F, Belitsch W, Kramer B. Separation of Universal and Non-Universal Scaling Regions in the IQHE. Microelectronic engineering. 1999;47:23-25.
Author
Bibtex - Download
@article{ddb988305d584e12a00fff46aab8544f,
title = "Separation of Universal and Non-Universal Scaling Regions in the IQHE",
author = "R Meisels and Friedemar Kuchar and W Belitsch and B Kramer",
year = "1999",
language = "English",
volume = "47",
pages = "23--25",
journal = "Microelectronic engineering",
issn = "0167-9317",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Separation of Universal and Non-Universal Scaling Regions in the IQHE
AU - Meisels, R
AU - Kuchar, Friedemar
AU - Belitsch, W
AU - Kramer, B
PY - 1999
Y1 - 1999
M3 - Article
VL - 47
SP - 23
EP - 25
JO - Microelectronic engineering
JF - Microelectronic engineering
SN - 0167-9317
ER -
