Publikationen

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2012
Veröffentlicht
Quantitative Approaches for in situ SEM and TEM Deformation Studies
Dehm, G., Kiener, D., Motz, C., Pippan, R. & Smolka, M., 2012, in: Microscopy and microanalysis. 18, S. 736-737
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing
Moser, G., Felber, H., Rashkova, B., Imrich, P. J., Kirchlechner, C., Grosinger, W., Motz, C., Dehm, G. & Kiener, D., 2012, in: Practical metallography = Praktische Metallographie. 49, S. 343-355
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction
Daniel, R., Keckes, J. & Mitterer, C., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
TEM characterization of CrN thin films epitaxially grown on MgO (001)
Harzer, T. P., Kormout, K., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Thermally treated hard coatings characterized by XRD coupled with four-point bending
Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, in: Scripta materialia. 67, S. 748-751
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
2011
Veröffentlicht
A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant Substrates
Taylor, A. A., Cordill, M., Moser, G. & Dehm, G., 2011, in: Practical metallography = Praktische Metallographie. 48, S. 408-413
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Zhang, Z., Daniel, R. & Mitterer, C., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Atomic and electronic structures of a transition layer at the CrN/Cr interface
Zhang, Z., Daniel, R. & Mitterer, C., 2011, in: Journal of applied physics. 110, S. 043524-1-043524-4
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

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Forschungsportal

Publikationen

Quantitative Approaches for in situ SEM and TEM Deformation Studies

Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

TEM characterization of CrN thin films epitaxially grown on MgO (001)

Thermally treated hard coatings characterized by XRD coupled with four-point bending

X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant Substrates

Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM

Atomic and electronic structures of a transition layer at the CrN/Cr interface

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