Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods

Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods. / Martinschitz, Klaus-Jürgen; Eiper, Ernst; Keckes, Jozef.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

Martinschitz, K-J, Eiper, E & Keckes, J 2006, 'Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods', Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, USA / Vereinigte Staaten, 30/07/06 - 4/08/06.

Martinschitz, K.-J., Eiper, E., & Keckes, J. (2006). Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Martinschitz KJ, Eiper E, Keckes J. Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods. 2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Martinschitz, Klaus-Jürgen ; Eiper, Ernst ; Keckes, Jozef. / Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

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title = "Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods",

author = "Klaus-J{\"u}rgen Martinschitz and Ernst Eiper and Jozef Keckes",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

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TY - CONF

T1 - Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods

AU - Martinschitz, Klaus-Jürgen

AU - Eiper, Ernst

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Poster

T2 - Gordon Research Conference on thin film & small scale mechanical behavior

Y2 - 30 July 2006 through 4 August 2006

ER -

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