Rapid determination of stress factors and absolute residual stresses in thin films

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Rapid determination of stress factors and absolute residual stresses in thin films. / Martinschitz, K.J.; Eiper, E.; Massl, S. et al.
in: Journal of applied crystallography, Jahrgang 39, 2006, S. 777-783.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Author

Martinschitz, K.J. ; Eiper, E. ; Massl, S. et al. / Rapid determination of stress factors and absolute residual stresses in thin films. in: Journal of applied crystallography. 2006 ; Jahrgang 39. S. 777-783.

Bibtex - Download

@article{643139a5e9804ef0b8b5e2a8f5c16e85,
title = "Rapid determination of stress factors and absolute residual stresses in thin films",
author = "K.J. Martinschitz and E. Eiper and S. Massl and Harald K{\"o}stenbauer and Rostislav Daniel and Gerardo Fontalvo and Christian Mitterer and Jozef Keckes",
year = "2006",
doi = "10.1107/S002188980603322X",
language = "English",
volume = "39",
pages = "777--783",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Rapid determination of stress factors and absolute residual stresses in thin films

AU - Martinschitz, K.J.

AU - Eiper, E.

AU - Massl, S.

AU - Köstenbauer, Harald

AU - Daniel, Rostislav

AU - Fontalvo, Gerardo

AU - Mitterer, Christian

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

U2 - 10.1107/S002188980603322X

DO - 10.1107/S002188980603322X

M3 - Article

VL - 39

SP - 777

EP - 783

JO - Journal of applied crystallography

JF - Journal of applied crystallography

SN - 0021-8898

ER -