Rapid determination of stress factors and absolute residual stresses in thin films
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Rapid determination of stress factors and absolute residual stresses in thin films. / Martinschitz, K.J.; Eiper, E.; Massl, S. et al.
in: Journal of applied crystallography, Jahrgang 39, 2006, S. 777-783.
in: Journal of applied crystallography, Jahrgang 39, 2006, S. 777-783.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Martinschitz, KJ, Eiper, E, Massl, S, Köstenbauer, H, Daniel, R, Fontalvo, G, Mitterer, C & Keckes, J 2006, 'Rapid determination of stress factors and absolute residual stresses in thin films', Journal of applied crystallography, Jg. 39, S. 777-783. https://doi.org/10.1107/S002188980603322X
APA
Martinschitz, K. J., Eiper, E., Massl, S., Köstenbauer, H., Daniel, R., Fontalvo, G., Mitterer, C., & Keckes, J. (2006). Rapid determination of stress factors and absolute residual stresses in thin films. Journal of applied crystallography, 39, 777-783. https://doi.org/10.1107/S002188980603322X
Vancouver
Martinschitz KJ, Eiper E, Massl S, Köstenbauer H, Daniel R, Fontalvo G et al. Rapid determination of stress factors and absolute residual stresses in thin films. Journal of applied crystallography. 2006;39:777-783. doi: 10.1107/S002188980603322X
Author
Bibtex - Download
@article{643139a5e9804ef0b8b5e2a8f5c16e85,
title = "Rapid determination of stress factors and absolute residual stresses in thin films",
author = "K.J. Martinschitz and E. Eiper and S. Massl and Harald K{\"o}stenbauer and Rostislav Daniel and Gerardo Fontalvo and Christian Mitterer and Jozef Keckes",
year = "2006",
doi = "10.1107/S002188980603322X",
language = "English",
volume = "39",
pages = "777--783",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Rapid determination of stress factors and absolute residual stresses in thin films
AU - Martinschitz, K.J.
AU - Eiper, E.
AU - Massl, S.
AU - Köstenbauer, Harald
AU - Daniel, Rostislav
AU - Fontalvo, Gerardo
AU - Mitterer, Christian
AU - Keckes, Jozef
PY - 2006
Y1 - 2006
U2 - 10.1107/S002188980603322X
DO - 10.1107/S002188980603322X
M3 - Article
VL - 39
SP - 777
EP - 783
JO - Journal of applied crystallography
JF - Journal of applied crystallography
SN - 0021-8898
ER -
