Phase stability and decomposition products of Ti-Al-Ta-N thin films
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Phase stability and decomposition products of Ti-Al-Ta-N thin films. / Rachbauer, Richard; Holec, David; Mayrhofer, Paul Heinz.
in: Applied physics letters, Jahrgang 97, 2010, S. 151901-1-151901-3.
in: Applied physics letters, Jahrgang 97, 2010, S. 151901-1-151901-3.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Rachbauer, R, Holec, D & Mayrhofer, PH 2010, 'Phase stability and decomposition products of Ti-Al-Ta-N thin films', Applied physics letters, Jg. 97, S. 151901-1-151901-3.
APA
Rachbauer, R., Holec, D., & Mayrhofer, P. H. (2010). Phase stability and decomposition products of Ti-Al-Ta-N thin films. Applied physics letters, 97, 151901-1-151901-3.
Vancouver
Rachbauer R, Holec D, Mayrhofer PH. Phase stability and decomposition products of Ti-Al-Ta-N thin films. Applied physics letters. 2010;97:151901-1-151901-3.
Author
Bibtex - Download
@article{53e5a91871974916ab9ffdc14a790fa0,
title = "Phase stability and decomposition products of Ti-Al-Ta-N thin films",
author = "Richard Rachbauer and David Holec and Mayrhofer, {Paul Heinz}",
year = "2010",
language = "English",
volume = "97",
pages = "151901--1--151901--3",
journal = "Applied physics letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Phase stability and decomposition products of Ti-Al-Ta-N thin films
AU - Rachbauer, Richard
AU - Holec, David
AU - Mayrhofer, Paul Heinz
PY - 2010
Y1 - 2010
M3 - Article
VL - 97
SP - 151901-1-151901-3
JO - Applied physics letters
JF - Applied physics letters
SN - 0003-6951
ER -
