Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy. / Andreev, Andrei; Teichert, Christian.
2005. Postersitzung präsentiert bei 52nd Annual International Symposium of the American Vacuum Society (AVS), Boston, Massachusetts, USA / Vereinigte Staaten.
2005. Postersitzung präsentiert bei 52nd Annual International Symposium of the American Vacuum Society (AVS), Boston, Massachusetts, USA / Vereinigte Staaten.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Andreev, A & Teichert, C 2005, 'Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy', 52nd Annual International Symposium of the American Vacuum Society (AVS), Boston, USA / Vereinigte Staaten, 31/10/05 - 4/11/05.
APA
Andreev, A., & Teichert, C. (2005). Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy. Postersitzung präsentiert bei 52nd Annual International Symposium of the American Vacuum Society (AVS), Boston, Massachusetts, USA / Vereinigte Staaten.
Vancouver
Andreev A, Teichert C. Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy. 2005. Postersitzung präsentiert bei 52nd Annual International Symposium of the American Vacuum Society (AVS), Boston, Massachusetts, USA / Vereinigte Staaten.
Author
Bibtex - Download
@conference{e9962f0170e846deb811226cbf26c6fe,
title = "Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy",
author = "Andrei Andreev and Christian Teichert",
year = "2005",
language = "English",
note = "52nd Annual International Symposium of the American Vacuum Society (AVS) ; Conference date: 31-10-2005 Through 04-11-2005",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
AU - Andreev, Andrei
AU - Teichert, Christian
PY - 2005
Y1 - 2005
M3 - Poster
T2 - 52nd Annual International Symposium of the American Vacuum Society (AVS)
Y2 - 31 October 2005 through 4 November 2005
ER -
