Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. / Keckes, Jozef; Bartosik, Matthias; Daniel, Rostislav et al.
2010. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.
2010. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Keckes, J, Bartosik, M, Daniel, R, Mitterer, C, Maier, G, Schoeder, S & Burghammer, M 2010, 'Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films', Applications of X-ray Analysis, Denver, USA / Vereinigte Staaten, 2/10/10 - 6/10/10.
APA
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S., & Burghammer, M. (2010). Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.
Vancouver
Keckes J, Bartosik M, Daniel R, Mitterer C, Maier G, Schoeder S et al.. Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. 2010. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.
Author
Bibtex - Download
@conference{20e6cdbab8944808bd369691aae7dd5a,
title = "Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films",
author = "Jozef Keckes and Matthias Bartosik and Rostislav Daniel and Christian Mitterer and G. Maier and S Schoeder and M. Burghammer",
year = "2010",
language = "English",
note = "Applications of X-ray Analysis ; Conference date: 02-10-2010 Through 06-10-2010",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
AU - Keckes, Jozef
AU - Bartosik, Matthias
AU - Daniel, Rostislav
AU - Mitterer, Christian
AU - Maier, G.
AU - Schoeder, S
AU - Burghammer, M.
PY - 2010
Y1 - 2010
M3 - Poster
T2 - Applications of X-ray Analysis
Y2 - 2 October 2010 through 6 October 2010
ER -
