Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Standard

Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. / Keckes, Jozef; Bartosik, Matthias; Daniel, Rostislav et al.
2010. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Harvard

Keckes, J, Bartosik, M, Daniel, R, Mitterer, C, Maier, G, Schoeder, S & Burghammer, M 2010, 'Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films', Applications of X-ray Analysis, Denver, USA / Vereinigte Staaten, 2/10/10 - 6/10/10.

APA

Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S., & Burghammer, M. (2010). Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.

Vancouver

Keckes J, Bartosik M, Daniel R, Mitterer C, Maier G, Schoeder S et al.. Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. 2010. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.

Author

Keckes, Jozef ; Bartosik, Matthias ; Daniel, Rostislav et al. / Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films. Postersitzung präsentiert bei Applications of X-ray Analysis, Denver, Colorado, USA / Vereinigte Staaten.

Bibtex - Download

@conference{20e6cdbab8944808bd369691aae7dd5a,
title = "Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films",
author = "Jozef Keckes and Matthias Bartosik and Rostislav Daniel and Christian Mitterer and G. Maier and S Schoeder and M. Burghammer",
year = "2010",
language = "English",
note = "Applications of X-ray Analysis ; Conference date: 02-10-2010 Through 06-10-2010",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

AU - Keckes, Jozef

AU - Bartosik, Matthias

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Maier, G.

AU - Schoeder, S

AU - Burghammer, M.

PY - 2010

Y1 - 2010

M3 - Poster

T2 - Applications of X-ray Analysis

Y2 - 2 October 2010 through 6 October 2010

ER -