Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films

Publikationen: KonferenzbeitragVortragForschung(peer-reviewed)

Standard

Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. / Daniel, Rostislav; Zalesak, Jakub; Mitterer, Christian et al.
2014. 41th International Conference on Metallurgical Coatings and Thin Films 2014, San Diego, USA / Vereinigte Staaten.

Publikationen: KonferenzbeitragVortragForschung(peer-reviewed)

Harvard

Daniel, R, Zalesak, J, Mitterer, C, Riedl, A, Sartory, B, Keckes, J & Schöberl, T 2014, 'Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films', 41th International Conference on Metallurgical Coatings and Thin Films 2014, San Diego, USA / Vereinigte Staaten, 28/04/14 - 2/05/14.

APA

Daniel, R., Zalesak, J., Mitterer, C., Riedl, A., Sartory, B., Keckes, J., & Schöberl, T. (2014). Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. 41th International Conference on Metallurgical Coatings and Thin Films 2014, San Diego, USA / Vereinigte Staaten.

Vancouver

Daniel R, Zalesak J, Mitterer C, Riedl A, Sartory B, Keckes J et al.. Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. 2014. 41th International Conference on Metallurgical Coatings and Thin Films 2014, San Diego, USA / Vereinigte Staaten.

Author

Daniel, Rostislav ; Zalesak, Jakub ; Mitterer, Christian et al. / Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. 41th International Conference on Metallurgical Coatings and Thin Films 2014, San Diego, USA / Vereinigte Staaten.

Bibtex - Download

@conference{bb06461c5f6c42f884300d957f68cf06,
title = "Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films",
author = "Rostislav Daniel and Jakub Zalesak and Christian Mitterer and Angelika Riedl and B. Sartory and Jozef Keckes and T. Sch{\"o}berl",
year = "2014",
language = "English",
note = "41st ICMCTF ; Conference date: 28-04-2014 Through 02-05-2014",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films

AU - Daniel, Rostislav

AU - Zalesak, Jakub

AU - Mitterer, Christian

AU - Riedl, Angelika

AU - Sartory, B.

AU - Keckes, Jozef

AU - Schöberl, T.

PY - 2014

Y1 - 2014

M3 - Presentation

T2 - 41st ICMCTF

Y2 - 28 April 2014 through 2 May 2014

ER -