Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films
Research output: Contribution to conference › Presentation › Research › peer-review
Standard
Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. / Daniel, Rostislav; Zalesak, Jakub; Mitterer, Christian et al.
2014. 41st ICMCTF, San Diego, United States.
2014. 41st ICMCTF, San Diego, United States.
Research output: Contribution to conference › Presentation › Research › peer-review
Harvard
Daniel, R, Zalesak, J, Mitterer, C, Riedl, A, Sartory, B, Keckes, J & Schöberl, T 2014, 'Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films', 41st ICMCTF, San Diego, United States, 28/04/14 - 2/05/14.
APA
Daniel, R., Zalesak, J., Mitterer, C., Riedl, A., Sartory, B., Keckes, J., & Schöberl, T. (2014). Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. 41st ICMCTF, San Diego, United States.
Vancouver
Daniel R, Zalesak J, Mitterer C, Riedl A, Sartory B, Keckes J et al.. Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films. 2014. 41st ICMCTF, San Diego, United States.
Author
Bibtex - Download
@conference{bb06461c5f6c42f884300d957f68cf06,
title = "Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films",
author = "Rostislav Daniel and Jakub Zalesak and Christian Mitterer and Angelika Riedl and B. Sartory and Jozef Keckes and T. Sch{\"o}berl",
year = "2014",
language = "English",
note = "41st ICMCTF ; Conference date: 28-04-2014 Through 02-05-2014",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films
AU - Daniel, Rostislav
AU - Zalesak, Jakub
AU - Mitterer, Christian
AU - Riedl, Angelika
AU - Sartory, B.
AU - Keckes, Jozef
AU - Schöberl, T.
PY - 2014
Y1 - 2014
M3 - Presentation
T2 - 41st ICMCTF
Y2 - 28 April 2014 through 2 May 2014
ER -
