In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings. / Bartosik, M.; Pitonak, R.; Keckes, Jozef.
in: Advanced engineering materials, 2011, S. 705-711.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{0de865f9ba47427093651136baad4343,
title = "In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings",
author = "M. Bartosik and R. Pitonak and Jozef Keckes",
year = "2011",
language = "English",
pages = "705--711",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings

AU - Bartosik, M.

AU - Pitonak, R.

AU - Keckes, Jozef

PY - 2011

Y1 - 2011

M3 - Article

SP - 705

EP - 711

JO - Advanced engineering materials

JF - Advanced engineering materials

SN - 1438-1656

ER -