In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings. / Bartosik, M.; Pitonak, R.; Keckes, Jozef.
in: Advanced engineering materials, 2011, S. 705-711.
in: Advanced engineering materials, 2011, S. 705-711.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Bartosik, M, Pitonak, R & Keckes, J 2011, 'In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings', Advanced engineering materials, S. 705-711.
APA
Bartosik, M., Pitonak, R., & Keckes, J. (2011). In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings. Advanced engineering materials, 705-711.
Vancouver
Bartosik M, Pitonak R, Keckes J. In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings. Advanced engineering materials. 2011;705-711.
Author
Bibtex - Download
@article{0de865f9ba47427093651136baad4343,
title = "In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings",
author = "M. Bartosik and R. Pitonak and Jozef Keckes",
year = "2011",
language = "English",
pages = "705--711",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
AU - Bartosik, M.
AU - Pitonak, R.
AU - Keckes, Jozef
PY - 2011
Y1 - 2011
M3 - Article
SP - 705
EP - 711
JO - Advanced engineering materials
JF - Advanced engineering materials
SN - 1438-1656
ER -
